Customization: | Available |
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Application: | Industrial |
Warranty: | > 1Year |
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No. | Index | Discription |
1 | model | The 4 th generation EDX analyzer-Genius XRF series |
2 | Analysis method | Energy dispersive X-ray fluorescence analysis method |
3 | Measuring range of elements | Mg to U |
4 | Simultaneously detect elements | Simultaneously detect tens of elements |
5 | Processor and RAM | CUP:667MHz. RAM:256M. Maximum expanded storage:32G. Standard configuration: 2G, can store large data. |
6 | Content range | ppm~99.99% |
7 | Testing time | 3-30 seconds |
8 | GPS\WIFI | Built-in system |
9 | Battery time | Lithium battery. Maximum 7800mAH,8 hrs. Wide voltage (110V-220V) General Adapter. |
10 | Testing object | Solid, liquid, powder |
11 | Detector | 25mm2 0.3mil, SDD detector |
12 | Detector resolution | Lowest resolution can be 139eV |
13 | Excitation source | 40KV/100uA-Ag anode window miniature X light tube and high voltage source |
14 | Collimator and filter | Collimator of 4.0 or 2.0 diameter. automatic switch of 6 types filter groups. 12 kinds groups. |
15 | Video system | HD camera |
16 | Screen | TFT-LCD touch screen, resolution 640*480 |
17 | Detection limit | Lowest detection limit accounts to ppm level |
18 | Testing window | 12mm |
19 | Safety | Self-contained password manager mode |
20 | Gas charging system | Helium charging at ordinary pressure system |
21 | Data transmission | Digital multi-channel technology. SPI data transmission.quick analysis. High counting rate. Waterproof miniature USB. |
22 | Humidity | ≤90% |
23 | Temperature | -20~+50 |
24 | Size | 234×306×82mm(L×H×W) |